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Excimer Lamps
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REX-4
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KrCM-LHP
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- 172
NM light source
- 200
x 200 mm area illuminated
- 10
mW per sq. cm.
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- 116.5,
123.6nm
light
source
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Excimer refers to the bound excited upper
state of a molecule that breaks apart when a photon is emitted.
Resonance excites Excimer emission from its lamps with a proprietary RF
power supply.
Some of the UV emission wavelengths
for various gas fill and window combinations are shown below.
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Advantages of Excimer:
- NON TOXIC
- No toxic mercury vapor in lamp.
- NO HF-
and other acids, no toxic organic solvents result from lamp use.
- PROCESS
FRIENDLY- Cannot harm vacuum process with mercury vapor.
- NO
FLUIDS- process does not require fluids with consequent de-sorption and
contamination problems.
- EMIT
SINGLE PEAK -(wavelength) radiation with high output in UV or VUV
(Vacuum ultraviolet)
- CAN
TARGET SPECIFIC CHEMICAL
- LOW
ENERGY CONSUMPTION- Can be greater than 10%.
- BETTER
THAN LASERS - Excimer lasers are typically only 1 to 3 %
efficient.
- COOL
OPERATION - Low operating temperature (do not heat irradiated
surface).
- INSTANT
START - Typically start in less than 1 millisecond.
- MINIMUM
DAMAGE-UV absorbed in 1 micron layer
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Excimer Cleaning:
Excimer systems use a UV
cleaning process referred to as Dry Cleaning. This process
destroys and removes organic compounds with minimum impact on the
process stream. This is superior to wet cleaning as it does not
produce toxic liquids. Excimer destruction of organic compounds
takes place when contaminant molecules (e.g. photoresists, resins,
human skin oils, cleaning solvent residues, silicone oils, soldering
flux etc.) are broken down to simple non-toxic volatile molecular
fragments by the action of vacuum ultraviolet light (pictured below).
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Terms to Know:
Photo-oxidation
refers to the UV induced processes
referenced above which result in the breakdown of organic
compounds.
Atomically
clean
refers to a surface condition in which
the substrate has a contaminating film less than one molecule thick
leaving the substrate directly exposed.
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Semiconductor
and
Related
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- Dry
cleaning surface of silicon wafers and photo-resist films
- Dry
cleaning lithography masks
- Post
CMP
dry
cleaning
- Surface
conditioning
of
high
K materials
- UV
dry cleaning of interlayer dielectric (SOG)
- Optical
chemical
vapor
deposition
(CVD)
- PMMA
conditioning
(resist
smoothing)
- Post
dicing
dry
cleaning
of tape residues
- Pre-wire
bonding
dry
cleaning
- Dry
cleaning of backside of lead frames
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Plasma Display Panels
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- Pre-photo-resist,
Pre-sputtering
dry
cleaning
- Dry
cleaning before and after wet cleaning to improve yield
- PDP
phosphor evaluation systems using Excimer lamps and fiber optic UV
delivery systems
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Environmental and Medical
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- Toxic
waste
(e.g.
CFC's,
PCB's, dioxin's, trichloroethylene) destruction in
air/water streams by photo-oxidation
- Non
solvent cleaning: of mechanical parts
- UV/Ozone
sterilization
of
medical
instruments and medical supplies
- Cleaning
glass
boards,
PDP
Fluorescent light and LCD
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Other
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- Improvement
for
non-exposed
part
surface of photo-resist film
- Soft-Ashing
- Pre-treatment
of
disc
surfaces,
i.e., CD and DVD
- Dry
cleaning ball bearings for hard disk drives
- Igniter
and
stabilizer
for
plasma etcher (Excimer used as an assist
light)
- Post-process
treatment
of
CMP
hardening of coatings and adhesives
- Generation
of
amorphous
material,
such as amorphous silicon solar cell
- Printing
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textile
printing,
finishing, printed circuits
- Reforming
surfaces
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ceramics,
surface etching
- Environmental
CLEAN
UP
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Contact Angle
Measurements:
- A simple
way to measure the cleaning of certain surfaces.
- Surface
tension of water droplets will depend on surface contamination.
- The angle
of contact of a water drop will decrease as the surface tension
decreases due to removal of surface contamination (on a hydrophilic
surfaces that wet easily)
The images below show surface cleaning
on a glass microscope slide with Excimer UV
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Start of Exposure (0
seconds) .................................................................After 30 Seconds of Exposure
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- Using
the
contact
angle
method it can be seen that 172 nm Excimer
light rapidly removes contamination from glass surfaces in 30 seconds
or less.
- The
strong dependence on distance to the sample results from the large
absorbance of O2 at 172 nm. This effect can be minimized by using a gas
mixture with a smaller O2 fraction than air.
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Example Measurements
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Copyright
Resonance
Ltd., February 2006
143 Ferndale Drive
North, Barrie, ON L4N 9V9 Tel:
705-733-3633 Fax:
705-733-1388 Email: res@resonance.on.ca
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